Catálogo Bibliográfico
1. | Spectroscopic ellipsometry and reflectometry : a user's guide / Harland G. Tompkins, William A. McGahan. | 1999 | Libro |
535
T662 |
2. | High-resolution X-ray scattering from thin films and multilayers / Václav Holý, Ullrich Pietsch, Tilo Baumbach. | 1999 | Libro |
HEMEROTECA
|
3. | Electron microdiffraction / J. C. H. Spence and J. M. Zuo. | 1992 | Libro |
537.533.35
S32 |
4. | Optics of thin films. — [reworked and supplemented ed.]. | 1960 | Libro |
535.31
V443 |