Advances in x-ray analysis. Volume 15 : proceedings of the twentieth annual Conference on Applications of X-Ray Analysis, held August 11-13, 1971

edited by Kurt F.J. Heinrich, Charles Sanborn Barrett, John B. Newkirk, and Clayton O. Ruud ; sponsored by University of Denver, Denver Research Institute, Metallurgy and Materials Science Division.

New York : Plenum Press, 1972.

xii, 573 págs. : ilustraciones ; 26 cm.