Catálogo Bibliográfico
1. | Quantitative electron-probe microanalysis. — 2nd ed. | 1995 | Libro |
537.533.35
S85 Ed. 2 |
2. | X-ray spectrometry in electron beam instruments / edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury. | 1995 | Libro |
543.51
W671 |
3. | Advanced scanning electron microscopy and X-ray microanalysis / Dale E. Newbury ... [et al.]. | 1986 | Libro |
537.533.35
N428 |