Papers presented at the 1997 ICAM/E-MRS spring conference : Symposium C : Recent developments in electron microscopy and X-ray diffaction of thin film structures, Strasbourg, France, June 16-20, 1997
Guest editors, A. M. Rocher ... [et al.].
Amsterdam : Elsevier, 1998.
viii, 279 págs.
Serie: Thin Solid Films, v. 319, nos. 1-2 0040-6090 ;
Incluye referencias bibliográficas e índices.