Catálogo Bibliográfico
Autores varios | ||||
1. | Advanced scanning electron microscopy and X-ray microanalysis / Dale E. Newbury ... [et al.]. | 1986 | Libro |
537.533.35
N428 |
2. | Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy. — 4th ed. | 2018 | Libro |
537.533.35
G578 Ed.4 |
3. | X-ray spectrometry in electron beam instruments / edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury. | 1995 | Libro |
543.51
W671 |