Diffraction and imaging techniques in material science
editors, Severin Amelinckx, R. Gevers, J. Van Landuyt.
2nd, rev. ed.
Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.
2 vols. (xvii, 847 págs., [1] fold. leaf of plates) : ilustraciones ; 23 cm.
ISBN: 0444851305
Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
2 ejs. de c/vol.
Incluye índice.
Incluye referencias bibliográficas.
Contenido
- v. 1. Electron microscopy.
- v. 2. Imaging and diffraction techniques.