Spectroscopic ellipsometry

Guest editors, R. W. Collins, E. D. Aspnes [and] E. A. Irene.

Amsterdam : Elsevier, 1998.

x, 850 págs.

Serie: Thin Solid Films, v. 313-314 0040-6090 ;

Resumen: Proceedings of the 2nd International Conference on Spectroscopy Ellipsometry, Charleston, South Carolina, USA

Incluye referencias bibliográficas e índices.