QH212.S34 S23 2014
502.8/25
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Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / [edited by] Nobuo Tanaka, Nagoya University, Japan.
— Hackensack, NJ : Imperial College Press, c2015. xxxiii, 571 p. : il. (some color) ; 24 cm.
Incluye referencias bibliográficas e índice.
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
ISBN 9781848167896 (hardcover alk. paper)
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