Frontiers of electron microscopy in materials science : proceedings of the sixth Conference on Frontiers in Electron Microscopy in Materials Science, Oak Brook, Illinois, USA, 4-7 June 1996.
Amsterdam : Elsevier Science, ©1997.
vii, 238 págs. : ilustraciones ; 27 cm.
Serie: Ultramicroscopy, v. 67, no. 1-4 0304-3991 ;
"The sixth Conference on Frontiers of Electron Microscopy in Materials Science"—Foreword.
Edited by: Stevan A. Bradley, Charles W. Allen, Wayne E. King.
Incluye indices.
Incluye referencias bibliográficas.