Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation
Edited by: James W. Mayer and James F. Ziegler.
Lausanne : Elsevier Sequoia S.A., 1974.
viii, 463 págs. : ilustraciones ; 25 cm.
ISBN: 044419536X
"These proceedings were originally published in Thin solid films."
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