Diffraction and imaging techniques in material science

editors, Severin Amelinckx, R. Gevers, J. Van Landuyt.

2nd, rev. ed.

Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978.

2 vols. (xvii, 847 págs., [1] fold. leaf of plates) : ilustraciones ; 23 cm.

ISBN: 0444851305

Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.

2 ejs. de c/vol.

Incluye índice.

Incluye referencias bibliográficas.