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International Symposium on In-situ Electron Microscopy (2003 : Nagoya-shi, Japan)
International Symposium on In-situ Electron Microscopy : Nagoya, Japan, 20-22 January 2003 / guest editor, H. Saka.
— Abingdon, UK : Taylor & Francis, c2004. p. 2595-2828 : il. (some col.) ; 25 cm. — (Philosophical magazine. structure and properties of condensed matter ; v. 84, no. 25-26 (2004 Set. 1-11).)
"Special issue."
Cover title.
Incluye referencias bibliográficas.
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