Point defects in semiconductors
M. Lannoo, J. Bourgoin.
Berlin : Springer, 1983.
ilustraciones ; 24 cm.
Serie: Springer series in solid-state sciences ; 22, 35
ISBN: 0387115153 (U.S. : v. 2)
Vol. 2 by J. Bourgoin, M. Lannoo, with a foreword by G.D. Watkins.
Incluye referencias bibliográficas e índice.
Contenido
- v. 2. Experimental aspects.
