Papers presented at the 1997 ICAM/E-MRS spring conference : Symposium C : Recent developments in electron microscopy and X-ray diffaction of thin film structures, Strasbourg, France, June 16-20, 1997

Guest editors, A. M. Rocher ... [et al.].

Amsterdam : Elsevier, 1998.

viii, 279 págs.

Serie: Thin Solid Films, v. 319, nos. 1-2 0040-6090 ;

Incluye referencias bibliográficas e índices.