Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.)
Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.
— Washington : U.S. National Bureau of Standards, 1964. vi, 359 p. : il. ; 24 cm. — (United States. National Bureau of Standards. Miscellaneous publication ; 256.)
Edited by E. Passaglia, R.R. Strombery, and J. Kruger.
Incluye referencias bibliográficas.
|