Título/responsables | Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings. |
Publicación |
Washington : U.S. National Bureau of Standards, 1964. |
Detalles físicos |
vi, 359 págs. : ilustraciones ; 24 cm. |
Colección | United States. National Bureau of Standards. Miscellaneous publication ; 256.
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Notas |
- Edited by E. Passaglia, R.R. Strombery, and J. Kruger.
- Incluye referencias bibliográficas.
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Temas |
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Nombres |
Passaglia, Elio Stromberg, Robert R. Kruger, Jerome |
Reunión |
Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.) |
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