Catálogo Bibliográfico
APA Citation Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1964). Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings. Washington : U.S. National Bureau of Standards. |
MLA Citation Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings. Washington : U.S. National Bureau of Standards, 1964. |
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