Catálogo Bibliográfico
LDR | ·····cam##22·····4a#4500 |
001 | 013649 |
005 | 20070215083916.0 |
008 | 020529s2002####gw#a###f#b####001#0#eng## |
245 | 10 | $a Transmission electron microscopy and diffractometry of materials / $c Brent Fultz, James Howe. |
250 | ## | $a 2nd ed. |
260 | ## | $a Berlin ; $a New York : $b Springer, $c c2002. |
300 | ## | $a xxi, 748 p. : $b il. ; $c 24 cm. |
020 | ## | $a 3540437649 (alk. paper) |
100 | 1# | $a Fultz, B. $q (Brent) |
700 | 1# | $a Howe, James M., $d 1955- |
082 | 00 | $a 620.1/1299 $2 21 |
650 | #0 | $a Materials $x Microscopy. |
650 | #0 | $a Transmission electron microscopy. |
650 | #0 | $a X-ray diffractometer. |
650 | #7 | $a Microscopía electrónica por transmisión. $2 inist |
650 | #7 | $a Difractómetros de rayos X. $2 inist |
010 | ## | $a ##2002070720 |
050 | 00 | $a TA417.23 $b .F85 2002 |
504 | ## | $a Incluye referencias bibliográficas. |
040 | ## | $a DLC $c DLC $d DLC $b spa $d arbccab |
500 | ## | $a Incluye índice. |
856 | 41 | $3 Indice $u http://campi.cab.cnea.gov.ar/tocs/19990.pdf |