TA417.23 .D54 1978
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Diffraction and imaging techniques in material science / editors, Severin Amelinckx, R. Gevers, J. Van Landuyt.
— 2nd, rev. ed. — Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978. 2 v. (xvii, 847 p., [1] fold. leaf of plates) : il. ; 23 cm.
Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
2 ejs. de c/vol.
Incluye índice.
Incluye referencias bibliográficas.
Contenido: v. 1. Electron microscopy. — v. 2. Imaging and diffraction techniques.
ISBN 0444851305
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