Título/responsables | Diffraction and imaging techniques in material science / editors, Severin Amelinckx, R. Gevers, J. Van Landuyt. |
Edición |
2nd, rev. ed. |
Publicación |
Amsterdam ; New York : North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland, 1978. |
Detalles físicos |
2 vols. (xvii, 847 págs., [1] fold. leaf of plates) : ilustraciones ; 23 cm. |
Notas |
- Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science.
- 2 ejs. de c/vol.
- Incluye índice.
- Incluye referencias bibliográficas.
|
Contenido |
- v. 1. Electron microscopy.
- v. 2. Imaging and diffraction techniques.
|
ISBN |
0444851305 |
Temas |
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Nombres |
Amelinckx, Severin.
Gevers, R. Landuyt, J. van. |
Reunión |
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537.533.35 A23 Ed.2 | Vol. 1 537.533.35 A23 Ed.2 | Vol. 1 537.533.35 A23 Ed.2 1 | Vol. 2 537.533.35 A23 Ed.2 2 | Vol. 2 537.533.35 A23 Ed.2 2 | |
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