Accelerated testing : statistical models, test plans and data analyses
Wayne Nelson.
New York : Wiley, ©1990.
xiv, 601 págs. : ilustraciones ; 25 cm.
Serie: Wiley series in probability and mathematical statistics. Applied probability and statistics
ISBN: 0471522775
"A Wiley-Interscience publication."
Incluye índice.
Bibliografía: p. 561-577.