Catálogo Bibliográfico
LDR | ·····cam##22·····#a#4500 |
001 | 000416 |
005 | 20101019160107.0 |
008 | 890915s1990####nyua#####b####001#0#eng## |
245 | 10 | $a Accelerated testing : $b statistical models, test plans and data analyses / $c Wayne Nelson. |
260 | ## | $a New York : $b Wiley, $c c1990. |
300 | ## | $a xiv, 601 p. : $b il. ; $c 25 cm. |
504 | ## | $a Bibliografía: p. 561-577. |
490 | 0# | $a Wiley series in probability and mathematical statistics. Applied probability and statistics |
020 | ## | $a 0471522775 |
100 | 1# | $a Nelson, Wayne, $d 1936- |
080 | ## | $a 519.87 |
082 | 00 | $a 519.5 $2 20 |
650 | #0 | $a Failure time data analysis. |
650 | #0 | $a Reliability (Engineering) $x Statistical methods. |
650 | #0 | $a Accelerated life testing $x Statistical methods. |
650 | #7 | $a Aceleración. $2 inist |
650 | #7 | $a Ensayos. $2 inist |
650 | #7 | $a Modelos estadísticos. $2 inist |
650 | #7 | $a Fiabilidad. $2 inist |
650 | #7 | $a Análisis de tipos de fallo. $2 inist |
650 | #7 | $a Fallos. $2 inist |
010 | ## | $a ###89024853# |
050 | 00 | $a QA276 $b .N45 1990 |
040 | ## | $a DLC $c DLC $d DLC $b spa $d arbccab |
500 | ## | $a "A Wiley-Interscience publication." |
500 | ## | $a Incluye índice. |
856 | 42 | $3 Información biográfica $u http://www.loc.gov/catdir/bios/wiley047/89024853.html |
856 | 42 | $3 Reseña $u http://www.loc.gov/catdir/description/wiley031/89024853.html |