Catálogo Bibliográfico
LDR | ·····cam##22·····#a#4500 |
001 | 006699 |
005 | 20220920145104.0 |
008 | 740830r1974####sz#a#####b####101#0#eng## |
245 | 10 | $a Ion beam surface layer analysis ; $b proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation / $c Edited by: James W. Mayer and James F. Ziegler. |
260 | ## | $a Lausanne : $b Elsevier Sequoia S.A., $c 1974. |
300 | ## | $a viii, 463 p. : $b il. ; $c 25 cm. |
504 | ## | $a Incluye referencias bibliográficas. |
500 | ## | $a "These proceedings were originally published in Thin solid films." |
020 | ## | $a 044419536X |
111 | 2# | $a International Conference on Ion Beam Surface Layer Analysis $n (1st : $d 1973 : $c Yorktown Heights, N.Y.) |
700 | 1# | $a Mayer, James W. |
700 | 1# | $a Ziegler, James F. |
710 | 2# | $a National Science Foundation (U.S.) |
710 | 2# | $a International Business Machines Corporation. |
082 | 00 | $a 541/.3453 |
650 | #0 | $a Thin films $v Congresses. |
010 | ## | $a ###74000348# |
050 | 00 | $a QC176.82 $b .I55 1973 |
049 | ## | $a AR5A |
040 | ## | $a DLC $c DLC $d OCL $b spa $d arbccab |