QC176.82 .I55 1973
541/.3453
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International Conference on Ion Beam Surface Layer Analysis (1st : 1973 : Yorktown Heights, N.Y.)
Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation / Edited by: James W. Mayer and James F. Ziegler.
— Lausanne : Elsevier Sequoia S.A., 1974. viii, 463 p. : il. ; 25 cm.
"These proceedings were originally published in Thin solid films."
Incluye referencias bibliográficas.
ISBN 044419536X
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