Catálogo Bibliográfico
1. | High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology / Jon Orloff, Mark Utlaut, and Lynwood Swanson. | 2003 | Libro |
537.533.35
O711 |
2. | Ion tracks and microtechnology : principles and applications / Reimar Spohr ; edited by Klaus Bethge. | 1990 | Libro |
539.12
S64 |