Catálogo Bibliográfico
1. | Multiple-beam interference microscopy of metals / by S. Tolansky. | 1970 | Libro |
535.4
T574 M |
2. | Threshold signals / edited by James L. Lawson [and] George E. Uhlenbeck [under the supervision of the] Office of Scientific Research and Development, National Defense Research Committee. — 1st ed. | 1950 | Libro |
621.396.9
M382 v.24 |