Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990
[edited by] G. Bastard and H. Oppolzer.
Amsterdam : North-Holland, 1991.
537 págs. : ilustraciones, tablas ; 24 cm.
Serie: Applied Surface Science 1991 ; v. 50, no. 1-4
Incluye referencias bibliográficas e índice.
