Catálogo Bibliográfico
Alford, Terry L. | ||||
1. | Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer. | 2007 | Libro | |
Chu, Wei-Kan. | ||||
2. | Backscattering spectrometry / Wei-Kan Chu, James W. Mayer and Marc-A. Nicolet. | 1978 | Libro | |
International Conference on Ion Beam Surface Layer Analysis (1st : 1973 : Yorktown Heights, N.Y.) | ||||
3. | Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation / Edited by: James W. Mayer and James F. Ziegler. | 1974 | Libro |
537.534:061.3
I8 1973 |
Mayer, James W. | ||||
4. | Ion implantation in semiconductors, silicon and germanium / [by] James W. Mayer, Lennart Eriksson and John A. Davies. | 1970 | Libro |
621.382
M452 |
Nastasi, Michael Anthony. | ||||
5. | Ion-solid interactions : fundamentals and applications / Michael Anthony Nastasi, James W. Mayer, and James Karsten Hirvonen. | 1996 | Libro |
539.186
N17 |
Autores varios | ||||
6. | Ion beam handbook for material analysis / coordinating editors, by J. W. Mayer, E. Rimini ; chapter editors, B. R. Appleton ... [et al]. | 1977 | Libro | |
7. | Thin films, interdiffusion and reactions / edited by J. M. Poate, K. N. Tu [and] James W. Mayer. | 1978 | Libro |
621.382
P75 |