Catálogo Bibliográfico
Symposium D, Measurement Techniques for Technological Plasmas (1999 : Strasbourg, France) | ||||
1. | Proceedings of E-MRS 1999 Symposium D: Measurement Techniques for Technological Plasmas : 1-2 June 1999, Strasbourg, France / guest editor, Alan P. Webb. | 2000 | Libro |
VACUUM 2000
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Symposium F: Process Induced Defects in Semiconductors (1999 : Strasbourg, France) | ||||
2. | Papers presented at the European Materials Research Society 1999 Spring Meeting, Symposium F: Process Induced Defects in Semiconductors, June 1-4, 1999, Strasbourg, France / guest editors, A. Mesli, Wolfgang Schröter, J. Weber. | 2000 | Libro |
MATER. SCI. ENG. B 2000
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Symposium I, Microcrystalline and Nanocrystalline Semiconductors (1999 : Strasbourg, France) | ||||
3. | Papers presented at the European Materials Research Society 1999 Spring Meeting, Symposium I : Microcrystalline and Nanocrystalline Semiconductors, June 1-4, 1999, Strasbourg, France / guest editors, Markus Thönissen, Androula G. Nassiopoulou. | 2000 | Libro |
MATER. SCI. ENG. 2000
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