Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.
Washington : U.S. National Bureau of Standards, 1964.
vi, 359 págs. : ilustraciones ; 24 cm.
Serie: United States. National Bureau of Standards. Miscellaneous publication ; 256.
Edited by E. Passaglia, R.R. Strombery, and J. Kruger.
Incluye referencias bibliográficas.