Catálogo Bibliográfico
LDR | ·····pam##22·····#a#4500 |
001 | 000339 |
005 | 20101012170138.0 |
008 | 750607s1975####nyua#####b####001#0#eng## |
245 | 10 | $a Semiconductor measurements and instrumentation / $c W. R. Runyan. |
260 | ## | $a New York : $b McGraw-Hill, $c [1975] |
300 | ## | $a vii, 280 p. : $b il. ; $c 26 cm. |
490 | 0# | $a Texas Instruments electronics series |
504 | ## | $a Incluye referencias bibliográficas e índice. |
020 | ## | $a 0070542732 |
100 | 1# | $a Runyan, W. R. |
080 | ## | $a 621.382 |
082 | 00 | $a 537.6/22 |
650 | #0 | $a Semiconductors. |
650 | #7 | $a Materiales semiconductores. $2 inist |
010 | ## | $a ###75019035# |
050 | 00 | $a QC611.24 $b .R86 |
040 | ## | $a DLC $c DLC $d DLC $b spa $d arbccab |
856 | ## | $u http://campi.cab.cnea.gov.ar/tocs/19382.pdf |