Particle characterization in technology
editor, John Keith Beddow.
Boca Raton, Fla. : CRC Press, ©1984.
2 vols. : ilustraciones (some col.) ; 27 cm.
Serie: CRC series on fine particle science and technologyaUniscience series on fine particle science and technology
ISBN: 0849357845 (v. 1), 0849357853 (v. 2)
Incluye indices.
Incluye referencias bibliográficas.
Contenido
- v. 1. Applications and microanalysis
- v. 2. Morphological analysis.
