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International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures (1st : 1999 : Seattle)
SPM '99 : proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, USA, May-June1, 1999 / guest editor, J.K. Heinrich Hörber.
— Amsterdam : Elsevier, 2000. xiii, 314 p. : il. (some col.) ; 27 cm.
Issued as: Ultramicroscopy, v. 82, nos. 1-4 (Feb. 2000).
Incluye indices.
Incluye referencias bibliográficas.
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