Catálogo Bibliográfico

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001 018390
005 20220920145016.0
008 050902s2007####nyud###f#b####001#0#eng#c
245 10 $a Fundamentals of nanoscale film analysis / $c Terry L. Alford, Leonard C. Feldman and James W. Mayer.
260 ## $a New York, N.Y. ; $a London : $b Springer, $c c2007.
300 ## $a xiv, 336 p. : $b il. ; $c 25 cm.
504 ## $a Incluye referencias bibliográficas e índice.
520 ## $a From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.
020 ## $a 9781441939807
020 ## $a 978038729261 (e-book)
020 ## $a 0387292616 (e-book)
020 ## $a 9780387292601
100 1# $a Alford, Terry L.
700 1# $a Feldman, Leonard C.
700 1# $a Mayer, James W.
080 ## $a 539.23
082 00 $a 621.3815/2 $2 22
650 #7 $a Thin films. $2 inist
650 #7 $a Capas finas. $2 inist
650 #0 $a Nanostructured materials.
653 ## $a Field effect transistors.
653 ## $a Transistores de efecto de campo.
010 ## $a ##2005933265
016 7# $a 013426036 $2 Uk
040 ## $a UKM $c UKM $d IXA $d YDXCP $d COO $d DLC $d arbccab $b spa
856 41 $u https://images-na.ssl-images-amazon.com/images/I/41D%2B7Z54-GL.%5FSX327%5FBO1,204,203,200%5F.jpg $3 Tapa
856 41 $u http://campi.cab.cnea.gov.ar/tocs/23229.pdf $3 Indice

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