Catálogo Bibliográfico
APA Citation International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : (2001). SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000. Amsterdam ; Elsevier. |
MLA Citation International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000. Amsterdam ; New York : Elsevier, 2001. |
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