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International Conference on Particle Induced X-ray Emission and its Analytical Applications (4th : 1986 : Tallahassee, Fla.)
Particle induced x-ray emission and its analytical applications : proceedings of the Fourth International Conference on Particle Induced X-ray Emission and its Analytical Applications, Tallahassee, FL, USA, June 9-13, 1986 / editors, Henri Van Rinsvelt ... [et al.].
— Amsterdam : North-Holland, 1987. xv, 475 p. : il. ; 27 cm. — (Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, ISSN 0168-583X ; v. B22, nos. 1-3 (Mar. 1987))
Includes bibliographical references.
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