Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989

editor, Ronald D. Vis.

Amsterdam, Netherlands : North-Holland, 1990.

xvii, 589 págs. : ilustraciones ; 27 cm.

Serie: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 0168-583X ; v. B49, nos. 1-4 (Apr. 1990)

Cover title: Proceedings of the 5th International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989.

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