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International Conference on Particle Induced X-Ray Emission and its Analytical Applications (5th : 1989 : Amsterdam, Netherlands)
Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 / editor, Ronald D. Vis.
— Amsterdam, Netherlands : North-Holland, 1990. xvii, 589 p. : il. ; 27 cm. — (Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, ISSN 0168-583X ; v. B49, nos. 1-4 (Apr. 1990))
Cover title: Proceedings of the 5th International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989.
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