Título/responsables | Frontiers of electron microscopy in materials science : proceedings of the sixth Conference on Frontiers in Electron Microscopy in Materials Science, Oak Brook, Illinois, USA, 4-7 June 1996. |
Publicación |
Amsterdam : Elsevier Science, ©1997. |
Detalles físicos |
vii, 238 págs. : ilustraciones ; 27 cm. |
Colección | Ultramicroscopy, ISSN 0304-3991 ; v. 67, no. 1-4
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Notas |
- "The sixth Conference on Frontiers of Electron Microscopy in Materials Science"—Foreword.
- Edited by: Stevan A. Bradley, Charles W. Allen, Wayne E. King.
- Incluye indices.
- Incluye referencias bibliográficas.
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Temas |
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Reunión |
Conference on Frontiers of Electron Microscopy in Materials Science (6th : 1996 : Oak Brook, Ill.) |
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