Electron microscopy and analysis

Peter J. Goodhew, John Humphreys, Richard Beanland.

3rd ed.

London ; New York : Taylor & Francis, ©2001.

x, 251 págs. : ilustraciones ; 24 cm.

ISBN: 9780748409686

Resumen: Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Incluye referencias bibliográficas (p. [236]-237) e índice.