Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis

[edited by] Nobuo Tanaka, Nagoya University, Japan.

Hackensack, NJ : Imperial College Press, ©2015.

xxxiii, 571 págs. : ilustraciones (some color) ; 24 cm.

ISBN: 9781848167896 (hardcover : alk. paper)

Resumen: The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.

Incluye referencias bibliográficas e índice.