Título/responsables | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / [edited by] Nobuo Tanaka, Nagoya University, Japan. |
Publicación |
Hackensack, NJ : Imperial College Press, ©2015. |
Detalles físicos |
xxxiii, 571 págs. : ilustraciones (some color) ; 24 cm. |
Notas |
- Incluye referencias bibliográficas e índice.
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Resumen |
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Readership: Graduate students and researchers in the field of nanomaterials and nanostructures.
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ISBN |
9781848167896 (hardcover : alk. paper) |
Temas |
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Nombres |
Tanaka, Nobuo, 1949- |
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