Particle characterization in technology / editor, John Keith Beddow.
— Boca Raton, Fla. : CRC Press, c1984. 2 v. : il. (some col.) ; 27 cm. — (CRC series on fine particle science and technology) (Uniscience series on fine particle science and technology)
Incluye indices.
Incluye referencias bibliográficas.
Contenido: v. 1. Applications and microanalysis — v. 2. Morphological analysis.
ISBN 0849357845 (v. 1). — ISBN 0849357853 (v. 2)
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