Catálogo Bibliográfico
LDR | ·····pam##22·····#a#4500 |
001 | 012993 |
005 | 20100104150910.0 |
008 | 980717s1999####nyua###f#b####001#0#eng## |
245 | 10 | $a Spectroscopic ellipsometry and reflectometry : $b a user's guide / $c Harland G. Tompkins, William A. McGahan. |
260 | ## | $a New York : $b Wiley, $c c1999. |
300 | ## | $a xiv, 228 p. : $b il. ; $c 24 cm. |
020 | ## | $a 0471181722 (cloth : acid-free paper) |
100 | 1# | $a Tompkins, Harland G. |
700 | 1# | $a McGahan, William A., $d 1966- |
082 | 00 | $a 681/.25 $2 21 |
650 | #0 | $a Ellipsometry. |
650 | #0 | $a Reflectometer. |
650 | #0 | $a Materials $x Optical properties. |
650 | #0 | $a Thin films $x Optical properties. |
650 | #0 | $a Surfaces (Technology) |
650 | #7 | $a Elipsometría. $2 inist |
010 | ## | $a ###98038199# |
050 | 00 | $a QC443 $b .T63 1999 |
504 | ## | $a Incluye referencias bibliográficas. |
040 | ## | $a DLC $c DLC $d DLC $b spa $d arbccab |
500 | ## | $a "A Wiley-Interscience publication." |
500 | ## | $a Incluye índice. |
856 | 42 | $3 Indice $u http://campi.cab.cnea.gov.ar/tocs/19891.pdf |