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Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990 : Strasbourg, France)
Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 / [edited by] G. Bastard and H. Oppolzer.
— Amsterdam : North-Holland, 1991. 537 p. : il., tablas ; 24 cm. — (Applied Surface Science 1991 ; v. 50, no. 1-4)
Incluye referencias bibliográficas e índice.
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