Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation

Edited by: James W. Mayer and James F. Ziegler.

Lausanne : Elsevier Sequoia S.A., 1974.

viii, 463 págs. : ilustraciones ; 25 cm.

ISBN: 044419536X

"These proceedings were originally published in Thin solid films."

Incluye referencias bibliográficas.