Título/responsables | Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 / [edited by] G. Bastard and H. Oppolzer. |
Publicación |
Amsterdam : North-Holland, 1991. |
Detalles físicos |
537 págs. : ilustraciones, tablas ; 24 cm. |
Colección | Applied Surface Science 1991 ; v. 50, no. 1-4
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Notas |
- Incluye referencias bibliográficas e índice.
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Temas |
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Nombres |
Bastard, Gerald.
Oppolzer, Helmut. |
Reunión |
Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990 : Strasbourg, France) |
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