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International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : 2000 : Heidelberg, Germany)
SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 / guest editor, David P. Allison.
— Amsterdam ; New York : Elsevier, 2001. xii, 254 p. : il. ; 26 cm. — (Ultramicroscopy ; v. 86, nos. 1/2)
Incluye referencias bibliográficas.
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